Eman Maali (Imperial College London), Omar Alrawi (Georgia Institute of Technology), Julie McCann (Imperial College London)

With the proliferation of IoT devices, network device identification is essential for effective network management and security. Many exhibit performance degradation despite the potential of machine learning-based IoT device identification solutions. Degradation arises from the assumption of static IoT environments that do not account for the diversity of real-world IoT networks, as devices operate in various modes and evolve over time. In this paper, we evaluate current IoT device identification solutions using curated datasets and representative features across different settings. We consider key factors that affect real-world device identification, including modes of operation, spatio-temporal variations, and traffic sampling, and organise them into a set of attributes by which we can evaluate current solutions. We then use machine learning explainability techniques to pinpoint the key causes of performance degradation. This evaluation uncovers empirical evidence of what continuously identifies devices, provides valuable insights, and practical recommendations for network operators to improve their IoT device identification in operational deployments.

View More Papers

A Systematic Evaluation of Novel and Existing Cache Side...

Fabian Rauscher (Graz University of Technology), Carina Fiedler (Graz University of Technology), Andreas Kogler (Graz University of Technology), Daniel Gruss (Graz University of Technology)

Read More

BinEnhance: An Enhancement Framework Based on External Environment Semantics...

Yongpan Wang (Institute of Information Engineering Chinese Academy of Sciences & University of Chinese Academy of Sciences, China), Hong Li (Institute of Information Engineering Chinese Academy of Sciences & University of Chinese Academy of Sciences, China), Xiaojie Zhu (King Abdullah University of Science and Technology, Thuwal, Saudi Arabia), Siyuan Li (Institute of Information Engineering Chinese…

Read More

Detecting Ransomware Despite I/O Overhead: A Practical Multi-Staged Approach

Christian van Sloun (RWTH Aachen University), Vincent Woeste (RWTH Aachen University), Konrad Wolsing (RWTH Aachen University & Fraunhofer FKIE), Jan Pennekamp (RWTH Aachen University), Klaus Wehrle (RWTH Aachen University)

Read More