Johnathan Wilkes, John Anny (Palo Alto Networks)

By embracing automation, organizations can transcend manual limitations to reduce mean time to response and address exposures consistently across their cybersecurity infrastructure. In the dynamic realm of cybersecurity, swiftly addressing externally discovered exposures is paramount, as each represents a ticking time bomb. A paradigm shift towards automation to enhance speed, efficiency, and uniformity in the remediation process is needed to answer the question, "You found the exposure, now what?". Traditional manual approaches are not only time-consuming but also prone to human error, underscoring the need for a comprehensive, automated solution. Acknowledging the diversity of exposures and the array of security tools, we will propose how to remediate common external exposures, such as open ports and dangling domains. The transformative nature of this shift is crucial, particularly in the context of multiple cloud platforms with distinct data enrichment and remediation capabilities.

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WIP: Security Vulnerabilities and Attack Scenarios in Smart Home...

Haoqiang Wang (Chinese Academy of Sciences, University of Chinese Academy of Sciences, Indiana University Bloomington), Yichen Liu (Indiana University Bloomington), Yiwei Fang, Ze Jin, Qixu Liu (Chinese Academy of Sciences, University of Chinese Academy of Sciences, Indiana University Bloomington), Luyi Xing (Indiana University Bloomington)

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Eavesdropping on Black-box Mobile Devices via Audio Amplifier's EMR

Huiling Chen (College of Computer Science and Electronic Engineering, Hunan University, Changsha, China), Wenqiang Jin (College of Computer Science and Electronic Engineering, Hunan University, Changsha, China), Yupeng Hu (College of Computer Science and Electronic Engineering, Hunan University, Changsha, China), Zhenyu Ning (College of Computer Science and Electronic Engineering, Hunan University, Changsha, China), Kenli Li (College…

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Detecting Voice Cloning Attacks via Timbre Watermarking

Chang Liu (University of Science and Technology of China), Jie Zhang (Nanyang Technological University), Tianwei Zhang (Nanyang Technological University), Xi Yang (University of Science and Technology of China), Weiming Zhang (University of Science and Technology of China), NengHai Yu (University of Science and Technology of China)

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