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CLIK on PLCs! Attacking Control Logic with Decompilation and...

Sushma Kalle (University of New Orleans), Nehal Ameen (University of New Orleans), Hyunguk Yoo (University of New Orleans), Irfan Ahmed (Virginia Commonwealth University)

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Matthew Revelle, Matt Parker, Kevin Orr (Kudu Dynamics)

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Binary Mutation Analysis of Tests Using Reassembleable Disassembly

Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)

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