Guy Amit (Ben-Gurion University), Moshe Levy (Ben-Gurion University), Yisroel Mirsky (Ben-Gurion University)

Deep neural networks are normally executed in the forward direction. However, in this work, we identify a vulnerability that enables models to be trained in both directions and on different tasks. Adversaries can exploit this capability to hide rogue models within seemingly legitimate models. In addition, in this work we show that neural networks can be taught to systematically memorize and retrieve specific samples from datasets. Together, these findings expose a novel method in which adversaries can exfiltrate datasets from protected learning environments under the guise of legitimate models.

We focus on the data exfiltration attack and show that modern architectures can be used to secretly exfiltrate tens of thousands of samples with high fidelity, high enough to compromise data privacy and even train new models. Moreover, to mitigate this threat we propose a novel approach for detecting infected models.

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The Impact of Workload on Phishing Susceptibility: An Experiment

Sijie Zhuo (University of Auckland), Robert Biddle (University of Auckland and Carleton University, Ottawa), Lucas Betts, Nalin Asanka Gamagedara Arachchilage, Yun Sing Koh, Danielle Lottridge, Giovanni Russello (University of Auckland)

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Exploring the Influence of Prompts in LLMs for Security-Related...

Weiheng Bai (University of Minnesota), Qiushi Wu (IBM Research), Kefu Wu, Kangjie Lu (University of Minnesota)

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PrintListener: Uncovering the Vulnerability of Fingerprint Authentication via the...

Man Zhou (Huazhong University of Science and Technology), Shuao Su (Huazhong University of Science and Technology), Qian Wang (Wuhan University), Qi Li (Tsinghua University), Yuting Zhou (Huazhong University of Science and Technology), Xiaojing Ma (Huazhong University of Science and Technology), Zhengxiong Li (University of Colorado Denver)

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Efficient and Timely Revocation of V2X Credentials

Gianluca Scopelliti (Ericsson & KU Leuven), Christoph Baumann (Ericsson), Fritz Alder (KU Leuven), Eddy Truyen (KU Leuven), Jan Tobias Mühlberg (Université libre de Bruxelles & KU Leuven)

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